IEEE International Test Conference – India

Marvell Presents at International Test Conference

International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems, covering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement.

Marvell Presentations

Panel Discussion: The role of AI in improving EDA tools and SOC test methodologies: Opportunities and Challenges
Date: July 22, 2024
Time: 4:00 - 5:30 PM
Marvell Presenter: Navin Bishnoi, India Country Manager, Marvell

Keynote Presentation: Accelerated Compute’s Impact on Test Development
Date: July 23, 2024
Time: 10:15 – 11:00 am
Marvell Presenter: Bill Cornwell, associate vice president, hardware engineering, Custom Compute and Storage Group, Marvell

Industry Session: Targeting bridges and opens with physical defect based approach
Date: July 23, 2024
Time: 2.00 - 3.30 pm
Marvell Presenter: Suraj M C , Principal Engineer, Central CAD and Design Services Group, Marvell

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IEEE International Test Conference – India

Marvell Presents at International Test Conference

Marvell Presentations

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